Publikationen des Geschäftsfelds Diamantbauelemente


2018Reusch, Markus; Ambacher, Oliver (Referent); Fiederle, Michael (Referent) :
AlN-based Electro-Acoustic Sensors for Analytics in Liquids: From Material Development to the Device
Freiburg/Brsg., Univ., Diss., 2018
2018Choudhury, Sneha; Kiendl, Benjamin; Ren, Jian; Gao, Fang; Knittel, Peter; Nebel, Christoph E.; Venerosy, Amélie; Girard, Hugues; Arnault, Jean-Charles; Krueger, Anke; Larsson, Karin; Petit, Tristan:
Combining nanostructuration with boron doping to alter sub band gap acceptor states in diamond materials
In: Journal of materials chemistry. A, Materials for energy and sustainability, Vol.6 (2018), No.34, pp.16645-16654
2018Bouvet-Marchand, Agathe; Graillot, Alain; Volk, János; Dauksevicius, Rolanas; Sturm, Chris; Grundmann, Marius; Saoutieff, Elise; Viana, Antoine; Christian, Björn; Lebedev, Vadim; Radó, J.; Lukács, István Endre; Nguyen, Khánh Q.; Grosso, David; Loubat, Cédric:
Design of UV-crosslinked polymeric thin layers for encapsulation of piezoelectric ZnO nanowires for pressure-based fingerprint sensors
In: Journal of materials chemistry. C, Materials for optical and electronic devices, Vol.6 (2018), No.3, pp.605-613
2018Seifikar, Masoud; Christian, Björn; Volk, János; Radó, János; Lukács, István E.; Dauksevicius, Rolanas; Gaidys, Rimvydas; Lebedev, Vadim; Viana, Antoine; O'Reilly, Eoin P.:
Direct observation of spontaneous polarization induced electron charge transfer in stressed ZnO nanorods
In: Nano energy, Vol.43 (2018), pp.376-382
2018Lu, Yuan; Reusch, Markus; Kurz, Nicolas; Ding, Anli; Christoph, Tim; Prescher, Mario; Kirste, Lutz; Ambacher, Oliver; Zukauskaite, Agne:
Elastic modulus and coefficient of thermal expansion of piezoelectric Al1-xScxN (up to x = 0.41) thin films
In: APL materials, Vol.6 (2018), No.7, Art. 076105, 6 pp.
2018Erlbacher, T.; Huerner, A.; Zhu, Y.; Bach, L.; Schletz, A.; Zürbig, Verena; Pinti, Lucas; Kirste, Lutz; Giese, Christian; Nebel, Christoph E.; Bauer, A.J.; Frey, L.:
Electrical properties of schottky-diodes based on B doped diamond
(International Conference on Silicon Carbide and Related Materials (ICSCRM) <2017, Washington/DC>)
In: Stahlbush, R.: Silicon Carbide and Related Materials 2017: International Conference on Silicon Carbide and Related Materials, ICSCRM 2017, September 17-22, 2017, Washington, DC. Durnten-Zurich: TTP, 2018. (Materials Science Forum 924), pp. 931-934
2018Knöbber, Fabian Andreas; Ambacher, Oliver; Wallrabe, Ulrike :
Entwicklung piezoelektrisch adaptiver Aluminiumnitrid/Diamant-Linsen für mikrooptische Systeme
Freiburg/Brsg., Univ., Diss., 2018
2018Loto, O.; Florentin, M.; Masante, N.; Donato, N.; Hicks, M.-L.; Pakpour-Tabrizi, A.C.; Jackman, R.B.; Zürbig, Verena; Godignon, B.; Eon, D.; Pernot, J.; Udrea, F.; Gheeraert, E.:
Gate oxide electrical stability of p-type diamond MOS capacitors
In: IEEE transactions on electron devices, Vol.65 (2018), No.8, pp.3361-3364
2018Knapp, Marius; Hoffmann, René; Lebedev, Vadim; Cimalla, Volker; Ambacher, Oliver:
Graphene as an active virtually massless top electrode for RF solidly mounted bulk acoustic wave (SMR-BAW) resonators
In: Nanotechnology, Vol.29 (2018), No.10, Art. 105302, 10 pp.
2018Tegetmeyer, Björn; Ambacher, Oliver :
Luminescence properties of SiV-centers in diamond diodes
Freiburg/Brsg., Univ., Diss., 2018
2018Knapp, Marius; Lebedev, Vadim; Cimalla, Volker; Ambacher, Oliver:
Metallization design investigations for graphene as a virtually massless electrode material for 2.1 GHz solidly mounted (BAW-SMR) resonators
(International Frequency Control Symposium (IFCS) <72, 2018, Olympic Valley/Calif.>)
In: Institute of Electrical and Electronics Engineers -IEEE-: IEEE International Frequency Control Symposium, IFCS 2018. Symposium Proceedings: May 21-24, 2018, Resort at Squaw Creek, Olympic Valley, CA, USA. Piscataway, NJ: IEEE, 2018, pp. 326-330
2018Gröner, Lukas; Kirste, Lutz; Oeser, Sabine; Fromm, Alexander; Wirth, Marco; Meyer, Frank; Burmeister, Frank; Eberl, Chris:
Microstructural investigations of polycrystalline Ti2AlN prepared by physical vapor deposition of Ti-AlN multilayers
In: Surface and coatings technology, Vol.343 (2018), pp.166-171
2018Sinusía Lozano, M.; Pérez-Campos, A.; Reusch, Markus; Kirste, Lutz; Fuchs, Theo; Zukauskaite, Agne; Chen, Z.; Iriarte, G.F.:
Piezoelectric characterization of Sc0.26Al0.74N layers on Si (001) substrates
In: Materials Research Express, Vol.5 (2018), No.3, Art. 036407, 10 pp.
2018Jia, Yuechen; Winkler, Markus; Cheng, Chen; Chen, Feng; Kirste, Lutz; Cimalla, Volker; Zukauskaite, Agne; Szabados, Jan; Breunig, Ingo; Buse, Karsten:
Pulsed laser deposition of ferroelectric potassium tantalate-niobate optical waveguiding thin films
In: Optical Materials Express, Vol.8 (2018), No.3, pp.541-548
2018Izquierdo, Javier; Knittel, Peter; Kranz, Christine:
Scanning electrochemical microscopy: An analytical perspective
In: Analytical and bioanalytical chemistry, Vol.410 (2018), No.2, pp.307-324
2018Leone, Stefano; Benkhelifa, Fouad; Kirste, Lutz; Manz, Christian; Müller, Stefan; Quay, Rüdiger; Stadelmann, Tim:
Suppression of iron memory effect in GaN epitaxial layers
In: Physica status solidi. B, Vol.255 (2018), No.5, Art. 1700377, 7 pp.
2018Lu, Yuan; Reusch, Markus; Kurz, Nicolas; Ding, Anli; Christoph, Tim; Kirste, Lutz; Lebedev, Vadim; Zukauskaite, Agne:
Surface morphology and microstructure of pulsed DC magnetron sputtered piezoelectric AlN and AlScN thin films
In: Physica status solidi. A, Vol.215 (2018), No.9, Art. 1700559, 6 pp.
2018Reusch, Markus; Holc, Katarzyna; Lebedev, Vadim; Kurz, Nicolas; Zukauskaite, Agne; Ambacher, Oliver:
Temperature cross-sensitivity of AlN-based flexural plate wave sensors
In: IEEE Sensors Journal, Vol.18 (2018), No.19, pp.7810-7818
2018Kurz, Nicolas; Lu, Yuan; Kirste, Lutz; Reusch, Markus; Zukauskaite, Agne; Lebedev, Vadim; Ambacher, Oliver:
Temperature dependence of the pyroelectric coefficient of AlScN thin films
In: Physica status solidi. A, Vol.215 (2018), No.13, Art. 1700831, 7 pp.
Diese Publikationsliste wurde aus der Publikationsdatenbank Fraunhofer-Publica erstellt.