Fraunhofer Institute for Applied Solid State Physics IAF2021
| Year | Author/Title/Source | Document Type |
|---|---|---|
| 2021 | Lebedev, Vadim; Engels, Jan; Kustermann, Jan; Weippert, Jürgen; Cimalla, Volker; Kirste, Lutz; Giese, Christian; Quellmalz, Patricia; Graff, Andreas; Meyer, Frank; Höfer, Markus; Sittinger, Volker:
Growth defects in heteroepitaxial diamond In: Journal of applied physics, Vol.129 (2021), No.16, Art. 165301, 14 pp. | Journal Article |
| 2021 | Choudhury, Sneha; Golnak, Ronny; Schulz, Christian; Lieutenant, Klaus; Tranchant, Nicolas; Arnault, Jean-Charles; Pinault-Thaury, Marie-Amandine; Jomard, Francois; Knittel, Peter; Petit, Tristan:
Impact of nitrogen, boron and phosphorus impurities on the electronic structure of diamond probed by x-ray spectroscopies In: C - Journal of Carbon Research, Vol.7 (2021), No.1, Art. 28, 9 pp. | Journal Article |
| 2021 | Zhang, Xufang; Matsumoto, Tsubasa; Nakano, Yuta; Noguchi, Hitoshi; Kato, Hiromitsu; Makino, Toshiharu; Takeuchi, Daisuke; Ogura, Masahiko; Yamasaki, Satoshi; Nebel, Christoph E.; Inokuma, Takao; Tokuda, Norio:
Inversion channel MOSFET on heteroepitaxially grown free-standing diamond In: Carbon, Vol.175 (2021), pp.615-619 | Journal Article |
| 2021 | Jin, Pei-Quing; Jeske, Jan; Greentree, Andrew D.; Cole, Jared H.:
Microwave quantum optics as a direct probe of the Overhauser field in a quantum dot circuit quantum electrodynamics device In: Physical Review. B, Vol.103 (2021), No.4, Art. 045301, 6 pp. | Journal Article |
| 2021 | Langer, Julia; Cimalla, Volker; Prescher, Mario; Ligl, Jana; Tegetmeyer, Björn; Schreyvogel, Christoph; Ambacher, Oliver:
Quality assessment of in situ plasma-etched diamond surfaces for chemical vapor deposition overgrowth In: Physica status solidi. A, Vol.218 (2021), No.11, Art. 2100035, 6 pp. | Journal Article |
| 2021 | Brandhofer, Sebastian; Devitt, Simon; Wellens, Thomas; Polian, Ilian:
Special session: Noisy intermediate-scale quantum (NISQ) computers - how they work, how they fail, how to test them? (VLSI Test Symposium (VTS) <39, 2021, Online>) In: Institute of Electrical and Electronics Engineers -IEEE-: IEEE 39th VLSI Test Symposium, VTS 2021. Proceedings: April 26th - 28th, 2021, Virtual Interactive Live Event. Piscataway, NJ: IEEE, 2021, pp. 231-240 | Conference Paper |
This publication list has been generated from the publication database Fraunhofer-Publica.