Our Services

Fraunhofer IAF offers its customers a wide range of measurement technologies as a service. These range from structural and chemical analysis of III-V semiconductor materials and epitaxial layers to high frequency measurement systems and an application laboratory for laser-based infrared spectroscopy.


Application lab for laser-based analytical infrared spectroscopy


High frequency measurement facilities


Analysis of semiconductors, thin films, and heterostructures




Module und ICs


Multiproject Wafer Runs