Our Services

Fraunhofer IAF offers its customers a wide range of measurement technologies as a service. These range from structural and chemical analysis of III-V semiconductor materials and epitaxial layers to high frequency measurement systems and an application laboratory for laser-based infrared spectroscopy.

 

Application lab for laser-based analytical infrared spectroscopy

 

High frequency measurement facilities

 

Analysis of semiconductors, thin films, and heterostructures

 

Epitaxy-on-demand

 

Module und ICs

 

Multiproject Wafer Runs