Measurement Services

Fraunhofer IAF offers a wide range of measurement techniques and services. These cover the chemical and structural analysis of III-V semiconductor materials and epitaxial layers, high-frequency measurement facilities, as well as an application laboratory for laser-based infrared spectroscopy. These capabilities are in many aspects unique. In the high frequency field we are for example able to measure S-parameters up to a frequency of 1.1 THz.

 

Application lab for laser-based analytical infrared spectroscopy

 

High frequency measurement facilities

 

Analysis of semiconductors, thin films, and heterostructures